KSEA events Study on the chemical/electronic structures of organic functional materials by combining photoemission spectroscopy with argon gas cluster ion beam sputtering (181214 KSEA Berkeley Chapter Seminar)

Abstract: Ultraviolet photoemission spectroscopy (UPS) and X-ray photoemission spectroscopy (XPS) have been the most common methods used in various fields to characterize the chemical bonding states, orientations, and compositions in the surface regions of organic/inorganic materials. The surface region is not free from contamination, chemical reactions, or dangling bonds under air-exposed conditions, and for many materials, the surface region has properties obviously distinct from those of the bulk region. Therefore, to study the chemical state of the bulk region without obvious sputtering damage, the Ar gas cluster ion beam (GCIB) sputtering process is applied and a variety of material combinations are studied in terms of the structural and chemical properties. Along with practical research results obtained by the analytical method mentioned above, the ambient pressure XPS that is undergoing in Advance Light Source would be briefly introduced as well.

 

BIO: Dr. Dong-Jin Yun is an analytical researcher in Samsung Advanced Institute of Technology. He received Ph.D. and B.S. in Chemical Engineering at POSTECH, Korea. From Jan. 31 to now, he is working on ambient pressure x-ray photoemission spectroscopy in Crumlin's group of Advanced Light Source.